Advances in thin-film coatings for optical applications III [electronic resource] : 13-14 August, 2006, San Diego, California, USA / Michael J. Ellison, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
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| Other title: | Advances in thin film coatings for optical applications. SPIE digital library. |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
©2006.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 6286. |
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Table of Contents:
- Deposition of multilayer optical coatings using closed-field magnetron sputtering / D.R. Gibson [and others]
- Characterisation of optical thin films obtained by plasma ion assisted deposition / Frank Placido [and others]
- Analysis of (TiO2)X(Ta2O5)1-X composite films prepared by radio frequency ion beam sputtering deposition / Chien-Jen Tang, Yung-Chi Wu, and Cheng-Chung Lee
- Wavefront control of UV narrow bandpass filters prepared by plasma ion-assisted deposition / Jue Wang, Robert L. Maier, and Horst Schreiber
- High-power DPL thin films prepared by ion beam sputtering / Hongxiang Liu, Shengming Xiong, and Yundong Zhang
- Advanced optical coating technology used in the development of concentrator arrays for solar space power applications / Michael L. Fulton and Mark J. O'Neill
- Optimized multilayer dielectric mirror coatings for gravitational wave interferometers / Juri Agresti [and others]
- A new design of thin-film grating optical low-pass filter and its fabrication / Cheng-Chung Lee and Sheng-Hui Chen
- Thin coatable birefringent film / Pavel I. Lazarev [and others]
- Investigation of cadmium alternatives in thin-film coatings / S.J. Wakeham and G.J. Hawkins
- Growth of zinc oxide thin films for optoelectronic application by pulsed laser deposition / K.J. Saji [and others]
- Fabrication of dense wavelength division multiplexing filters with large useful area / Cheng-Chung Lee [and others]
- Tunable thin film filters for intelligent WDM networks / Michael Cahill [and others]
- Transmission ellipsometry of transparent-film transparent-substrate systems: polynomial inversion for the substrate optical constant / M. Elshazly-Zaghloul, Y.A. Zaghloul, and A.R.M. Zaghloul
- In-situ reflectivity measurement for antireflection coating on laser diode facet / Chetan J. Panchal [and others]
- Optical response and light scattering measurements from a planar guided wave / Raúl García-Llamas [and others]
- Optical properties of Er3+ + Yb3+ doped gallium nitride layers / Vaclav Prajzler [and others]
- Theoretical description and experiment to prove the bistability of the semiconductor laser diode / Vítzslav Jeábek and Ivan Hüttel
- X-measuring ellipsometer (XME): a novel ellipsometric technique to fully characterize film-substrate systems / A.R.M. Zaghloul and Y.A. Zaghloul.