A comparison of different texture analysis techniques [electronic resource]
Saved in:
| Online Access: |
Online Access |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1996.
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| Subjects: |
| Abstract: | With the advent of automated techniques for measuring individual crystallographic orientations using electron diffraction, there has been an increase in the use of local orientation measurements for measuring textures in polycrystalline materials. Several studies have focused on the number of single orientation measurements necessary to achieve the statistics of more conventional texture measurement, techniques such as pole figure measurement using x-ray and neutron diffraction. This investigation considers this question but also is extended to consider the nature of the differences between textures measured using individual orientation measurements and those measured using x-ray diffraction. |
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| Item Description: | Published through the Information Bridge: DOE Scientific and Technical Information. 08/01/1996. "LA-UR--96-1893" "CONF-9609220--1" "DE96012160" 11. textures of materials conference, Xian (China), 16-20 Sep 1996. Wright, S.I.; Kocks, U.F. |
| Physical Description: | 12 p. |