Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM grating spectrometer [electronic resource]
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| Online Access: |
Online Access |
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| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Livermore, Calif : Oak Ridge, Tenn. :
Lawrence Livermore National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1994.
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| Abstract: | A prototype array consisting of eight diffraction gratings has been fabricated for the XMM Reflection Grating Spectrometer. A component of the full spectrometer is an array of approximately 200 diffraction gratings. The diffraction gratings were produced using lightweight silicon carbide substrates and a replication technique. The prototype array was developed and assembled using the same tolerances as the flight arrays which have typical tolerances of 3 μm in translation and sub-arc seconds in rotation. The metrology applied during inspection and assembly included precision linear measurements, full aperture figure measurements, and angular interferometry. |
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| Item Description: | Published through the Information Bridge: DOE Scientific and Technical Information. 07/01/1994. "ucrl-jc--117808" " conf-940723--14" "DE94016605" Annual meeting of the Society of Photo-Optical Instrumentation Engineers,San Diego, CA (United States),24-29 Jul 1994. Decker, T.A.; Kahn, S.M.; Hailey, C.J.; Bixler, J.V.; Montesanti, R.C. USDOE, Washington, DC (United States);National Aeronautics and Space Administration, Washington, DC (United States) |
| Physical Description: | 11 p. : digital, PDF file. |