Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM grating spectrometer [electronic resource]

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Bibliographic Details
Online Access: Online Access
Corporate Author: Lawrence Livermore National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Livermore, Calif : Oak Ridge, Tenn. : Lawrence Livermore National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1994.
Subjects:

MARC

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245 0 0 |a Development, fabrication, and metrology of the electro-optical breadboard model for the reflection grating array of the XMM grating spectrometer  |h [electronic resource] 
260 |a Livermore, Calif :  |b Lawrence Livermore National Laboratory ;  |a Oak Ridge, Tenn. :  |b distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,  |c 1994. 
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500 |a 07/01/1994. 
500 |a "ucrl-jc--117808" 
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500 |a "DE94016605" 
500 |a Annual meeting of the Society of Photo-Optical Instrumentation Engineers,San Diego, CA (United States),24-29 Jul 1994. 
500 |a Decker, T.A.; Kahn, S.M.; Hailey, C.J.; Bixler, J.V.; Montesanti, R.C. 
500 |a USDOE, Washington, DC (United States);National Aeronautics and Space Administration, Washington, DC (United States) 
520 3 |a A prototype array consisting of eight diffraction gratings has been fabricated for the XMM Reflection Grating Spectrometer. A component of the full spectrometer is an array of approximately 200 diffraction gratings. The diffraction gratings were produced using lightweight silicon carbide substrates and a replication technique. The prototype array was developed and assembled using the same tolerances as the flight arrays which have typical tolerances of 3 μm in translation and sub-arc seconds in rotation. The metrology applied during inspection and assembly included precision linear measurements, full aperture figure measurements, and angular interferometry. 
536 |b W-7405-ENG-48. 
650 7 |a Design.  |2 local. 
650 7 |a Testing.  |2 local. 
650 7 |a Diffraction Gratings.  |2 local. 
650 7 |a X-ray Spectrometers.  |2 local. 
650 7 |a Silicon Carbides.  |2 local. 
650 7 |a Optics.  |2 local. 
650 7 |a Other Instrumentation.  |2 edbsc. 
710 2 |a Lawrence Livermore National Laboratory.  |4 res. 
710 1 |a United States.  |b Department of Energy.  |b Office of Scientific and Technical Information.  |4 dst. 
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