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CoU |
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20080618000000.0 |
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100524e19921001nyu s| f1|||||eng|d |
| 035 |
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|a (TOE)ost10190439
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| 035 |
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|a (TOE)10190439
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| 040 |
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|a TOE
|c TOE
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| 049 |
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|a GDWR
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| 072 |
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|a 75
|2 edbsc
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| 086 |
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|a E 1.99: conf-9208150--1
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| 086 |
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|a E 1.99:bnl--48003
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| 086 |
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|a E 1.99: conf-9208150--1
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| 245 |
0 |
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|a Synchrotron radiation induced x-ray micro analysis
|h [electronic resource] :
|b A realistic alternative for electron- and ion beam microscopy?
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| 260 |
|
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|a Upton, N.Y. :
|b Brookhaven National Laboratory ;
|a Oak Ridge, Tenn. :
|b distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
|c 1992.
|
| 300 |
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|a 49 p. :
|b digital, PDF file.
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| 336 |
|
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|a text
|b txt
|2 rdacontent.
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| 337 |
|
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|a computer
|b c
|2 rdamedia.
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| 338 |
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|a online resource
|b cr
|2 rdacarrier.
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| 500 |
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|a Published through the Information Bridge: DOE Scientific and Technical Information.
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| 500 |
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|a 10/01/1992.
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| 500 |
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|a "bnl--48003"
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| 500 |
|
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|a " conf-9208150--1"
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| 500 |
|
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|a "DE93001975"
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| 500 |
|
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|a ": Grant Nr. 2009291N"
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| 500 |
|
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|a "Grant EAR 89-14669"
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| 500 |
|
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|a 27. annual meeting of the Microbeam Analysis Society (MAS) (United States) and the 19th annual meeting of the Microscopical Society of Canada (MSC),Boston, MA (United States),Aug 1992.
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| 500 |
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|a Jones, K.W.; Adams, F.; Rivers, M.L.; Janssens, K.
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| 500 |
|
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|a USDOE, Washington, DC (United States);National Science Foundation, Washington, DC (United States);Belgian National Science Fund (Belgium)
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| 520 |
3 |
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|a Synchrotron Radiation induced X-ray micro Fluorescence analysis (μ-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.
|
| 536 |
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|b AC02-76CH00016.
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| 650 |
|
7 |
|a Multi-element Analysis.
|2 local.
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| 650 |
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7 |
|a Electron Microprobe Analysis.
|2 local.
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| 650 |
|
7 |
|a Sensitivity.
|2 local.
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| 650 |
|
7 |
|a Comparative Evaluations.
|2 local.
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| 650 |
|
7 |
|a Ion Microscopy.
|2 local.
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| 650 |
|
7 |
|a Silicon.
|2 local.
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| 650 |
|
7 |
|a Synchrotron Radiation.
|2 local.
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| 650 |
|
7 |
|a Trace Amounts.
|2 local.
|
| 650 |
|
7 |
|a Potassium.
|2 local.
|
| 650 |
|
7 |
|a Aerosols.
|2 local.
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| 650 |
|
7 |
|a X-ray Fluorescence Analysis.
|2 local.
|
| 650 |
|
7 |
|a Elements.
|2 local.
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| 650 |
|
7 |
|a Fluorescence Spectroscopy.
|2 local.
|
| 650 |
|
7 |
|a Aluminium.
|2 local.
|
| 650 |
|
7 |
|a Iron.
|2 local.
|
| 650 |
|
7 |
|a Sodium.
|2 local.
|
| 650 |
|
7 |
|a Condensed Matter Physics, Superconductivity And Superfluidity.
|2 edbsc.
|
| 710 |
2 |
|
|a Brookhaven National Laboratory.
|4 res.
|
| 710 |
1 |
|
|a United States.
|b Department of Energy.
|b Office of Scientific and Technical Information.
|4 dst.
|
| 856 |
4 |
0 |
|u http://www.osti.gov/servlets/purl/10190439-pf9RbA/
|z Online Access
|
| 907 |
|
|
|a .b5971556x
|b 03-06-23
|c 05-26-10
|
| 998 |
|
|
|a web
|b 05-26-10
|c f
|d m
|e p
|f eng
|g nyu
|h 0
|i 1
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| 956 |
|
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|a Information bridge
|
| 999 |
f |
f |
|i f89d0fcf-281d-5c92-b1ca-0bd02a202d80
|s ff6a6f7c-8c9d-5f0d-878b-b14e026b3539
|
| 952 |
f |
f |
|p Can circulate
|a University of Colorado Boulder
|b Online
|c Online
|d Online
|e E 1.99: conf-9208150--1
|h Superintendent of Documents classification
|i web
|n 1
|
