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m d f |
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cr un |
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100524e19910101dcu s| f1|||||eng|d |
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|a (TOE)ost5062229
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|a E 1.99:conf-910862-5
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|a E 1.99:conf-910862-5
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|a Effect of powder sample granularity on fluorescent intensity and on thermal parameters in x-ray diffraction Rietveld analysis
|h [electronic resource]
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| 260 |
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|a Washington, D.C. :
|b United States. Dept. of Defense ;
|a Oak Ridge, Tenn. :
|b distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
|c 1991.
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| 300 |
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|a Pages: (6 p) :
|b digital, PDF file.
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| 336 |
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|a text
|b txt
|2 rdacontent.
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| 337 |
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|a computer
|b c
|2 rdamedia.
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|a online resource
|b cr
|2 rdacarrier.
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|a Published through the Information Bridge: DOE Scientific and Technical Information.
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|a 01/01/1991.
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|a "conf-910862-5"
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|a "DE92001675"
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|a Pacific-international congress on x-ray analytical methods, Honolulu, HI (United States), 12-16 Aug 1991.
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|a Sparks, C.J.; Kumar, R.; Specht, E.D.; Ice, G.E.; Zschack, P.; Shiraishi, T.; Hisatsune, K.
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| 520 |
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|a The effect of sample granularity on diffracted x-ray intensity was evaluated by measuring the 2θ dependence of x-ray fluorescence from various samples. Measurements were made in the symmetric geometry on samples ranging from single crystals to highly absorbing coarse powders. A characteristic shape for the absorption correction was observed. A demonstration of the sensitivity of Rietveld refined site occupation parameters is made on CuAu and Cu₅₀Au₄₄Ni₆ alloys refined with and without granularity corrections. These alloys provide a good example of the effect of granularity due to their large linear x-ray absorption coefficients. Sample granularity and refined thermal parameters obtained from the Rietveld analysis were found to be correlated. Without a granularity correction, the refined thermal parameters are too low and can actually become negative in an attempt to compensate for granularity. A general shape for granularity correction can be included in refinement procedures. If no granularity correction is included, data should be restricted to above 30° 2θ, and thermal parameters should be ignored unless extreme precautions are taken to produce >5 μm particles and high packing densities.
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|b AC05-84OR21400.
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| 650 |
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|a Surface Properties.
|2 local.
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| 650 |
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|a X-ray Diffraction.
|2 local.
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|a Scattering.
|2 local.
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|a Diffraction.
|2 local.
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|a Fluorescence.
|2 local.
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|a Copper Base Alloys.
|2 local.
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| 650 |
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|a Nickel Alloys.
|2 local.
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| 650 |
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|a Gold Alloys.
|2 local.
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|a Coherent Scattering.
|2 local.
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| 650 |
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|a Powders.
|2 local.
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| 650 |
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|a Copper Alloys.
|2 local.
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| 650 |
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|a Roughness.
|2 local.
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| 650 |
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|a Luminescence.
|2 local.
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| 650 |
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|a Alloys.
|2 local.
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| 650 |
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|a Materials Science.
|2 edbsc.
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| 710 |
2 |
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|a Oak Ridge National Laboratory.
|4 res.
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| 710 |
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|a United States.
|b Department of Defense.
|4 spn.
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| 710 |
1 |
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|a United States.
|b Department of Energy.
|4 spn.
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| 710 |
1 |
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|a United States.
|b Department of Energy.
|b Office of Scientific and Technical Information.
|4 dst.
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| 856 |
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|u http://www.osti.gov/servlets/purl/5062229-1CKCM6/
|z Online Access
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| 907 |
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|a .b59859489
|b 03-06-23
|c 05-27-10
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| 998 |
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|a web
|b 05-27-10
|c f
|d m
|e p
|f eng
|g dcu
|h 0
|i 1
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|a Information bridge
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| 999 |
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|i e209358f-d810-564d-bb25-11d51065c479
|s 43320d31-efd0-5a2e-b2bb-e3afdbf44840
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| 952 |
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|p Can circulate
|a University of Colorado Boulder
|b Online
|c Online
|d Online
|e E 1.99:conf-910862-5
|h Superintendent of Documents classification
|i web
|n 1
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