Effect of powder sample granularity on fluorescent intensity and on thermal parameters in x-ray diffraction Rietveld analysis [electronic resource]

Saved in:
Bibliographic Details
Online Access: Online Access
Corporate Author: Oak Ridge National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Dept. of Defense ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1991.
Subjects:

Internet

Online Access

Online

Holdings details from Online
Call Number: E 1.99:conf-910862-5
E 1.99:conf-910862-5 Available