Trace element measurements using white synchrotron radiation [electronic resource]
Saved in:
| Online Access: |
Online Access |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Upton, N.Y. : Oak Ridge, Tenn. :
Brookhaven National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1986.
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| Subjects: |
| Abstract: | Synchrotron radiation, when used for x-ray fluorescence (XRF) has several advantages over conventional x-ray sources. Our group at Brookhaven National Laboratory is developing the equipment and expertise to make XRF measurements with synchrotron radiation. The apparatus is briefly described, along with the alignment techniques. Some minimum detectable limits for trace elements in thin biological standards measured with white light irradiations are presented. |
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| Item Description: | Published through the Information Bridge: DOE Scientific and Technical Information. 11/10/1986. "bnl-39105" " conf-861114-46" "DE87005244" 9. international conference on application of accelerators in research and industry, Denton, TX, USA, 10 Nov 1986. Jones, K.W.; Long, G.J.; Hanson, A.L.; Sutton, S.R.; Rivers, M.L.; Gordon, B.M.; Kwiatek, W.M.; Pounds, J.G. Chicago Univ., IL (USA). Dept. of Geophysical Sciences. |
| Physical Description: | Pages: 21 : digital, PDF file. |