An Optimization Model for Test Assembly To Match Observed-Score Distributions. Research Report 94-7 [electronic resource] / Wim J. van der Linden and Richard M. Luecht.
An optimization model is presented that allows test assemblers to control the shape of the observed-score distribution on a test for a population with a known ability distribution. An obvious application is for item response theory-based test assembly in programs where observed scores are reported a...
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Format: | Electronic eBook |
Language: | English |
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[S.l.] :
Distributed by ERIC Clearinghouse,
1994.
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ED389752
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ED389752 | Available |