An Optimization Model for Test Assembly To Match Observed-Score Distributions. Research Report 94-7 [electronic resource] / Wim J. van der Linden and Richard M. Luecht.

An optimization model is presented that allows test assemblers to control the shape of the observed-score distribution on a test for a population with a known ability distribution. An obvious application is for item response theory-based test assembly in programs where observed scores are reported a...

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Bibliographic Details
Online Access: Full Text (via ERIC)
Main Author: Linden, Wim J. van der
Corporate Author: Technische Hogeschool Twente. Faculty of Educational Science and Technology
Other Authors: Luecht, Richard M.
Format: Electronic eBook
Language:English
Published: [S.l.] : Distributed by ERIC Clearinghouse, 1994.
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Call Number: ED389752
ED389752 Available