Scanning microscopy 2010 [electronic resource] : 17-19 May 2010, Monterey, California, United States / Michael T. Postek [and others], editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States)
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| Online Access: |
Full Text (via SPIE Digital Library) |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
©2010.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 7729. |
| Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
| Call Number: |
QH212.S3 .S346 2010e
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| QH212.S3 .S346 2010e | Available |