MEMS and nanotechnology. Volume 4 [electronic resource] : proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics / Tom Proulx, editor.
MEMS and Nanotechnology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.¡ The full set of proceedings also includes volu...
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| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
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Springer,
©2011.
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| Series: | Conference proceedings of the Society for Experimental Mechanics series.
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| Subjects: |
MARC
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| 111 | 2 | |a International Symposium on MEMS and Nanotechnology |n (12th : |d 2011 : |c Uncasville, Conn.) | |
| 245 | 1 | 0 | |a MEMS and nanotechnology. |n Volume 4 |h [electronic resource] : |b proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics / |c Tom Proulx, editor. |
| 260 | |a New York : |b Springer, |c ©2011. | ||
| 300 | |a 1 online resource (viii, 191 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
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| 490 | 1 | |a Conference proceedings of the Society for Experimental Mechanics series, |x 2191-5644. | |
| 504 | |a Includes bibliographical references. | ||
| 505 | 0 | |a Integrated Process Feasibility of Hard-mask for Tight Pitch Interconnects Fabrication -- Thermoelectric Effects in Current Induced Crystallization of Silicon Microstructures -- Evaluation of Resistance Measurement Techniques in Carbon Black and Carbon -- Nano-tubes Reinforced Epoxy -- A Nano-tensile Tester for Creep Studies -- The Measurement of Cyclic Creep Behavior in Copper Thin Film Using Microtensile Testing -- New Insight Into Pile-Up in Thin Film Indentation -- Measuring Substrate-independent Young's Modulus of Thin Films -- Analysis of Spherical Indentation of an Elastic Bilayer Using a Modified Perturbation Approach -- Nano-indentation Studies of Polyglactin 910 Monofilament Sutures -- Analytical Approach for the Determination of Nanomechanical Properties for Metals -- Advances in Thin Film Indentation -- Cyclic Nanoindentation Shakedown of Muscovite and its Elastic Modulus Measurement -- Assessment of Digital Holography for 3D-shape Measurement of Micro Deep Drawing Parts in Comparison to Confocal Microscopy -- Full-field Bulge Testing Using Global Digital Image Correlation -- Experimental Investigation of Deformation Mechanisms Present in Ultrafine-grained Metals -- Characterization of¡ a Variation on AFIT's Tunable MEMS Cantilever Array Metamaterial -- MEMS for Real-time Infrared Imaging -- New Insights Into Enhancing Microcantilever MEMS Sensors -- A Miniature MRI-compatible Fiber-optic Force Sensor Utilizing Fabry-Perot Interferometer -- Micromechanical Structure With Stable Linear Positive and Negative Stiffness -- Terahertz Metamaterial Structures Fabricated by PolyMUMPs -- Investigations Into 1D and 2D Metamaterials at Infrared Wavelengths -- MEMS Integrated Metamaterials With Variable Resonance Operating at RF Frequencies -- Creep Measurements in Free-standing Thin Metal Film Micro-cantilever Bending -- MEMS Reliability for Space Applications by Elimination of Potential Failure Modes Through Analysis -- Analysis and Evaluation Methods Associated With the Application of Compliant Thermal Interface Materials in Multi-chip Electronic Board Assemblies -- Hierarchical Reliability Model for Life Prediction of Actively Cooled LED-based Luminaire -- Direct Determination of Interfacial Traction-separation Relations in Chip-package Systems. | |
| 520 | |a MEMS and Nanotechnology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.¡ The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Microelectromechanical systems |v Congresses. |0 http://id.loc.gov/authorities/subjects/sh2008107748. | |
| 650 | 0 | |a Nanotechnology |v Congresses. |0 http://id.loc.gov/authorities/subjects/sh2008108196. | |
| 650 | 7 | |a Microelectromechanical systems. |2 fast |0 (OCoLC)fst01019745. | |
| 650 | 7 | |a Nanotechnology. |2 fast |0 (OCoLC)fst01032639. | |
| 655 | 7 | |a Conference papers and proceedings. |2 fast |0 (OCoLC)fst01423772. | |
| 700 | 1 | |a Proulx, Tom |q (Thomas William) |0 http://id.loc.gov/authorities/names/no2011109391 |1 http://isni.org/isni/0000000048470985. | |
| 711 | 2 | |a SEM Conference on Experimental and Applied Mechanics |d (2011 : |c Uncasville, Conn.) | |
| 830 | 0 | |a Conference proceedings of the Society for Experimental Mechanics series. |0 http://id.loc.gov/authorities/names/no2011108014. | |
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