MEMS and nanotechnology. Volume 4 [electronic resource] : proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics / Tom Proulx, editor.

MEMS and Nanotechnology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.¡ The full set of proceedings also includes volu...

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Bibliographic Details
Online Access: Full Text (via Springer)
Corporate Authors: International Symposium on MEMS and Nanotechnology Uncasville, Conn., SEM Conference on Experimental and Applied Mechanics
Other Authors: Proulx, Tom (Thomas William)
Format: Electronic Conference Proceeding eBook
Language:English
Published: New York : Springer, ©2011.
Series:Conference proceedings of the Society for Experimental Mechanics series.
Subjects:
Table of Contents:
  • Integrated Process Feasibility of Hard-mask for Tight Pitch Interconnects Fabrication
  • Thermoelectric Effects in Current Induced Crystallization of Silicon Microstructures
  • Evaluation of Resistance Measurement Techniques in Carbon Black and Carbon
  • Nano-tubes Reinforced Epoxy
  • A Nano-tensile Tester for Creep Studies
  • The Measurement of Cyclic Creep Behavior in Copper Thin Film Using Microtensile Testing
  • New Insight Into Pile-Up in Thin Film Indentation
  • Measuring Substrate-independent Young's Modulus of Thin Films
  • Analysis of Spherical Indentation of an Elastic Bilayer Using a Modified Perturbation Approach
  • Nano-indentation Studies of Polyglactin 910 Monofilament Sutures
  • Analytical Approach for the Determination of Nanomechanical Properties for Metals
  • Advances in Thin Film Indentation
  • Cyclic Nanoindentation Shakedown of Muscovite and its Elastic Modulus Measurement
  • Assessment of Digital Holography for 3D-shape Measurement of Micro Deep Drawing Parts in Comparison to Confocal Microscopy
  • Full-field Bulge Testing Using Global Digital Image Correlation
  • Experimental Investigation of Deformation Mechanisms Present in Ultrafine-grained Metals
  • Characterization of¡ a Variation on AFIT's Tunable MEMS Cantilever Array Metamaterial
  • MEMS for Real-time Infrared Imaging
  • New Insights Into Enhancing Microcantilever MEMS Sensors
  • A Miniature MRI-compatible Fiber-optic Force Sensor Utilizing Fabry-Perot Interferometer
  • Micromechanical Structure With Stable Linear Positive and Negative Stiffness
  • Terahertz Metamaterial Structures Fabricated by PolyMUMPs
  • Investigations Into 1D and 2D Metamaterials at Infrared Wavelengths
  • MEMS Integrated Metamaterials With Variable Resonance Operating at RF Frequencies
  • Creep Measurements in Free-standing Thin Metal Film Micro-cantilever Bending
  • MEMS Reliability for Space Applications by Elimination of Potential Failure Modes Through Analysis
  • Analysis and Evaluation Methods Associated With the Application of Compliant Thermal Interface Materials in Multi-chip Electronic Board Assemblies
  • Hierarchical Reliability Model for Life Prediction of Actively Cooled LED-based Luminaire
  • Direct Determination of Interfacial Traction-separation Relations in Chip-package Systems.