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|a (TOE)ost810525
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|a (TOE)810525
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|a E 1.99:bnl--67588
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|a E 1.99:bnl--67588
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|a bnl--67588
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|a MICROANALYSIS OF MATERIALS USING SYNCHROTRON RADIATION.
|h [electronic resource]
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| 260 |
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|a Washington, D.C. :
|b United States. Department of Energy. Office of Energy Research ;
|a Oak Ridge, Tenn. :
|b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
|c 2000.
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| 300 |
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|a 79 pages :
|b digital, PDF file.
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| 336 |
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|a text
|b txt
|2 rdacontent.
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| 337 |
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|a computer
|b c
|2 rdamedia.
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|a online resource
|b cr
|2 rdacarrier.
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|a Published through SciTech Connect.
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|a 12/01/2000.
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|a "bnl--67588"
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|a "KC0403010"
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|a FENG,H.; JONES,K.W.
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|a High intensity synchrotron radiation produces photons with wavelengths that extend from the infrared to hard x rays with energies of hundreds of keV with uniquely high photon intensities that can be used to determine the composition and properties of materials using a variety of techniques. Most of these techniques represent extensions of earlier work performed with ordinary tube-type x-ray sources. The properties of the synchrotron source such as the continuous range of energy, high degree of photon polarization, pulsed beams, and photon flux many orders of magnitude higher than from x-ray tubes have made possible major advances in the possible chemical applications. We describe here ways that materials analyses can be made using the high intensity beams for measurements with small beam sizes and/or high detection sensitivity. The relevant characteristics of synchrotron x-ray sources are briefly summarized to give an idea of the x-ray parameters to be exploited. The experimental techniques considered include x-ray fluorescence, absorption, and diffraction. Examples of typical experimental apparatus used in these experiments are considered together with descriptions of actual applications.
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|b AC02-98CH10886.
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|b AS333ESTD.
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|a Absorption.
|2 local.
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|a Detection.
|2 local.
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|a Diffraction.
|2 local.
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|a Fluorescence.
|2 local.
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|a Photons.
|2 local.
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|a Polarization.
|2 local.
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|a Microanalysis.
|2 local.
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|a Sensitivity.
|2 local.
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|a Synchrotron Radiation.
|2 local.
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|a Synchrotrons.
|2 local.
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|a Wavelengths.
|2 local.
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|a X-Ray Sources.
|2 local.
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|a X-Ray Tubes.
|2 local.
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|a Particle Accelerators.
|2 edbsc.
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| 710 |
2 |
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|a Brookhaven National Laboratory.
|4 res.
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| 710 |
1 |
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|a United States.
|b Department of Energy.
|b Office of Energy Research.
|4 spn.
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| 710 |
1 |
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|a United States.
|b Department of Energy.
|b Office of Scientific and Technical Information.
|4 dst.
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| 856 |
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|u http://www.osti.gov/servlets/purl/810525/
|z Online Access
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| 907 |
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|a .b69930727
|b 03-06-23
|c 03-31-12
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| 998 |
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|a web
|b 03-31-12
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|s 2aae7f8c-962b-55e1-b828-38604974fc21
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| 952 |
f |
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|p Can circulate
|a University of Colorado Boulder
|b Online
|c Online
|d Online
|e E 1.99:bnl--67588
|h Superintendent of Documents classification
|i web
|n 1
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