Temperature dependence of the interface moments in Co2MnSi thin films [electronic resource]
Xmcd Cms Tmr Tey Xas Icp.
Saved in:
| Online Access: |
Online Access |
|---|---|
| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Berkeley, Calif. : Oak Ridge, Tenn. :
Lawrence Berkeley National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
2008.
|
| Subjects: |
MARC
| LEADER | 00000nam a22000003u 4500 | ||
|---|---|---|---|
| 001 | b7050151 | ||
| 003 | CoU | ||
| 005 | 20080611000000.0 | ||
| 006 | m d f | ||
| 007 | cr ||||||||||| | ||
| 008 | 120331e20080315cau o| f0|||||eng|d | ||
| 035 | |a (TOE)ost928964 | ||
| 035 | |a (TOE)928964 | ||
| 040 | |a TOE |c TOE | ||
| 049 | |a GDWR | ||
| 072 | 7 | |a 75 |2 edbsc | |
| 086 | 0 | |a E 1.99:lbnl-257e | |
| 086 | 0 | |a E 1.99:lbnl-257e | |
| 088 | |a lbnl-257e | ||
| 245 | 0 | 0 | |a Temperature dependence of the interface moments in Co2MnSi thin films |h [electronic resource] |
| 260 | |a Berkeley, Calif. : |b Lawrence Berkeley National Laboratory ; |a Oak Ridge, Tenn. : |b distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, |c 2008. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a computer |b c |2 rdamedia. | ||
| 338 | |a online resource |b cr |2 rdacarrier. | ||
| 500 | |a Published through the Information Bridge: DOE Scientific and Technical Information. | ||
| 500 | |a 03/15/2008. | ||
| 500 | |a "lbnl-257e" | ||
| 500 | |a APPLIED PHYSICS LETTERS 92 ISSN 0003-6951; APPLAB FT. | ||
| 500 | |a Miyazaki, T.; Ando, Y.; Arenholz, E.; van der Laan, G.; Sakuraba, Y.; Arenholz, Elke; Telling, N.; Hicken, R.; Oogane, M.; Keatley, P.; Shelford, L. | ||
| 500 | |a Advanced Light Source Division. | ||
| 520 | 3 | |a X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co₂MnSi (CMS) thin films capped with aluminium. By increasing the thickness of the capping layer we demonstrate enhanced interface sensitivity of the measurements and the existence of a thin Mn oxide layer at the CMS/Al interface even when a thick capping layer is used. We show that for well ordered L2₁ CMS films there is no significant variation in either the Co or Mn interface moments as a function of temperature. However, a dramatic reduction in the interface moments at low temperature is observed in a disordered CMS film that is likely to be caused by increased Mn-Mn antiferromagnetic coupling. It is suggested that for ordered L2₁ CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments. However, the existence of residual Mn oxide at the CMS/barrier interface could be a contributing factor. | |
| 520 | 0 | |a Xmcd Cms Tmr Tey Xas Icp. | |
| 536 | |b DE-AC02-05CH11231. | ||
| 650 | 7 | |a Thickness. |2 local. | |
| 650 | 7 | |a Sensitivity. |2 local. | |
| 650 | 7 | |a Magnetoresistance. |2 local. | |
| 650 | 7 | |a Temperature Dependence. |2 local. | |
| 650 | 7 | |a Tunneling. |2 local. | |
| 650 | 7 | |a Oxides. |2 local. | |
| 650 | 7 | |a Magnetic Circular Dichroism. |2 local. | |
| 650 | 7 | |a Thin Films. |2 local. | |
| 650 | 7 | |a Aluminium. |2 local. | |
| 710 | 2 | |a Lawrence Berkeley National Laboratory. |4 res. | |
| 710 | 1 | |a United States. |b Department of Energy. |b Office of Scientific and Technical Information. |4 dst. | |
| 856 | 4 | 0 | |u http://www.osti.gov/servlets/purl/928964-UQtpG2/ |z Online Access |
| 907 | |a .b70501518 |b 03-07-23 |c 04-03-12 | ||
| 998 | |a web |b 04-03-12 |c f |d m |e p |f eng |g cau |h 0 |i 1 | ||
| 956 | |a Information bridge | ||
| 999 | f | f | |i 7017605e-a494-5778-954a-b570a13ce40f |s 78cf1736-ef12-5f3b-892f-425167156549 |
| 952 | f | f | |p Can circulate |a University of Colorado Boulder |b Online |c Online |d Online |e E 1.99:lbnl-257e |h Superintendent of Documents classification |i web |n 1 |