Measurement Of Transverse Jc Profiles Of Coated Conductors Using A Magnetic Knife Of Permanent Magnets [electronic resource]

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Bibliographic Details
Online Access: Online Access
Corporate Author: Los Alamos National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2008.
Subjects:

MARC

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245 0 0 |a Measurement Of Transverse Jc Profiles Of Coated Conductors Using A Magnetic Knife Of Permanent Magnets  |h [electronic resource] 
260 |a Washington, D.C. :  |b United States. Dept. of Energy ;  |a Oak Ridge, Tenn. :  |b distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,  |c 2008. 
336 |a text  |b txt  |2 rdacontent. 
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500 |a Published through the Information Bridge: DOE Scientific and Technical Information. 
500 |a 01/01/2008. 
500 |a "la-ur-08-04381" 
500 |a " la-ur-08-4381" 
500 |a Applied Physics Letters ISSN 0003-6951; APPLAB FT. 
500 |a Coulter, J Y; Mueller, F M; Ashworth, S P; Hanisch, J; Matias, Vlad. 
520 3 |a The transverse J{sub c} distribution in YBCO coated conductors was measured nondestructively with high resolution using a 'magnetic knife' made of permanent magnets. The method utilizes the strong depression of J{sub c} in applied magnetic fields. A narrow region of low (including zero) magnetic field, in a surrounding higher field, is moved transversely across the sample in order to reveal the critical-current density distribution. The net resolution of this device is approximately 65 μm, and the J{sub c} resolution is better than 0.5%. A Fourier series inversion process was used to determine the transverse J{sub c} distribution in the sample. The J{sub c} profile was correlated with other sample properties of coated conductors prepared by pulsed laser deposition. Because of its straight-forward and inexpensive design, this J{sub c} imaging technique can be a powerful tool for quality control in coated-conductor production. 
536 |b AC52-06NA25396. 
650 7 |a Superconductivity.  |2 local. 
650 7 |a Design.  |2 local. 
650 7 |a Deposition.  |2 local. 
650 7 |a Permanent Magnets.  |2 local. 
650 7 |a Production.  |2 local. 
650 7 |a Critical Current.  |2 local. 
650 7 |a Resolution.  |2 local. 
650 7 |a Yttrium Oxides.  |2 local. 
650 7 |a Magnetic Fields.  |2 local. 
650 7 |a High-tc Superconductors.  |2 local. 
650 7 |a Density.  |2 local. 
650 7 |a Barium Oxides.  |2 local. 
650 7 |a Quality Control.  |2 local. 
650 7 |a Copper Oxides.  |2 local. 
650 7 |a Distribution.  |2 local. 
710 2 |a Los Alamos National Laboratory.  |4 res. 
710 1 |a United States.  |b Department of Energy.  |4 spn. 
710 1 |a United States.  |b Department of Energy.  |b Office of Scientific and Technical Information.  |4 dst. 
856 4 0 |u http://www.osti.gov/servlets/purl/956592-2rP7Wh/  |z Online Access 
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