Atomic scale interconnection machines [electronic resource] : proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011 / Christian Joachim, editor.
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Full Text (via Springer) |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
©2012.
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| Series: | Advances in atom and single molecule machines.
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Table of Contents:
- High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects / B. Guenther, M. Maier, J. Koeble, A. Bettac and F. Matthes, et al.
- Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm / Vasily Cherepanov, Evgeny Zubkov, Hubertus Junker, Stefan Korte and Marcus Blab, et al.
- Atomic Scale Interconnection Machine / O.A. Neucheva, R. Thamankar, T.L. Yap, C. Troadec and J. Deng, et al.
- The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate / D. Martrou, L. Guiraud, R. Laloo, B. Pecassou and P. Abeilhou, et al.
- Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System / Zhouhang Wang
- On the Road to Multi-Probe Non-Contact AFM / T. Vančura, S. Schmitt, V. Friedli, S. Torbrügge and O. Schaff
- Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact / John N. Randall, James R. Von Ehr, Joshua Ballard, James Owen and Rahul Saini, et al.
- Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires / M. Berthe, C. Durand, T. Xu, J.P. Nys and P. Caroff, et al.
- Probing Electronic Transport of Individual Nanostructures with Atomic Precision / Shengyong Qin and An-Ping Li.
- Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System / R. Thamankar, O.A. Neucheva, T.L. Yap and C. Joachim
- Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing / M. Wojtaszek, M. Kolmer, S. Godlewski, J. Budzioch and B. Such, et al.
- Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM / S. Hasegawa, T. Hirahara, Y. Kitaoka, S. Yoshimoto and T. Tono, et al.
- Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope / Janik Zikovsky, Mark H. Salomons, Stanislav A. Dogel and Robert A. Wolkow
- Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy / J.A. Miwa and M.Y. Simmons
- Electronic Transport on the Nanoscale / C.A. Bobisch, A.M. Bernhart, M.R. Kaspers, M.C. Cottin and J. Schaffert, et al.
- Solid State Nano Gears Manipulations / Cedric Troadec, Jie Deng, Francisco Ample, Ramesh Thamankar and Christian Joachim
- Probing Single Molecular Motors on Solid Surface / Haiming Guo, Yeliang Wang, Min Feng, Li Gao and Hongjun Gao.