THE STRUCTURE OF GRAIN BOUNDARIES IN SILICON NITRIDE BASED ALLOYS [electronic resource]
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| Online Access: |
Online Access |
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| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Berkeley, Calif. : Oak Ridge, Tenn. :
Lawrence Berkeley National Laboratory ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1977.
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| Abstract: | Grain boundaries in silicon-based ceramics have been characterized by high resolution electron microscopy including the technique of lattice fringe imaging, and this work is illustrated with examples from both hot-pressed silicon nitrides (MgO and Y₂O₃ fluxed) and a magnesium-sialon (Mg{sub 1.86} Si{sub 1.67} Al{sub 2.47} O{sub 3.19} N{sub 3.81}). Room temperature observations of the glassy phase are consistent with it being only a partially wetting phase, indicating that it cannot form a continuous film. The atomic configuration of the grain boundaries in both materials is presented together with lattice fringe observations of segregation at grain boundaries in the magnesium-sialon. |
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| Item Description: | Published through the Information Bridge: DOE Scientific and Technical Information. 12/01/1977. "lbl-6985" 14th University Conference on Processing of Crystalline Ceramics, Raleigh, NC, November 7-9, 1977. Thomas, G.; Clarke, David R. Chemical Sciences Division. |
| Physical Description: | 20 p. : digital, PDF file. |