Ellipsometry at the nanoscale / Maria Losurdo, Kurt Hingerl, editors.

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...

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Bibliographic Details

Online Access:	Full Text (via Springer)
Other Authors:	Losurdo, Maria, Hingerl, Kurt
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, ©2013.
Subjects:	Ellipsometry. Polarimetry. Nanotechnology.