Ellipsometry at the nanoscale / Maria Losurdo, Kurt Hingerl, editors.
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...
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| Language: | English |
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Berlin ; New York :
Springer,
©2013.
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Table of Contents:
- A Brief History and State of the Art of Ellipsometry / Eugene A. Irene
- Advanced Mueller Ellipsometry Instrumentation and Data Analysis / Enric Garcia-Caurel, Razvigor Ossikovski, Martin Foldyna
- Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations / Josef Humlicek
- Relationship Between Surface Morphology and Effective Medium Roughness / Angel Yanguas-Gil, Herbert Wormeester
- Plasmonics and Effective-Medium Theory / David E. Aspnes
- Thin Films of Nanostructured Noble Metals / Herbert Wormeester, Thomas W.H. Oates
- Spectroscopic Ellipsometry on Metallic Gratings / Michael Bergmair, Kurt Hingerl, Peter Zeppenfeld
- Ellipsometry at the Nanostructure / Yasuhiro Mizutani, Yukitoshi Otani
- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles / Satoshi Tomita
- Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition / Daniel Schmidt, Eva Schubert, Mathias Schubert
- THz Generalized Ellipsometry Characterization of Highly-Ordered Three-Dimensional Nanostructures / Tino Hofmann, Daniel Schmidt, Mathias Schubert
- Infrared Ellipsometric Investigations of Free Carriers and Lattice Vibrations in Superconducting Cuprates / Jiří Chaloupka, Dominik Munzar, Josef Humlíček
- Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale / Maria Losurdo, April S. Brown, Giovanni Bruno
- Polarimetric and Other Optical Probes for the Solid-Liquid Interface / Kurt Hingerl
- Spectroscopic Ellipsometry for Functional Nano-Layers of Flexible Organic Electronic Devices / Stergios Logothetidis, Argiris Laskarakis
- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications / Alain C. Diebold, Florence J. Nelson, Vimal K. Kamineni
- Ellipsometry of Semiconductor Nanocrystals / Peter Petrik, Miklos Fried
- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry / Stefan Zollner
- Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry / Denis Cattelan, Céline Eypert, Marzouk Kloul
- Ellipsometry and Correlation Measurements / Rados Gajic, Milka Jakovljevic
- Nanotechnology: Applications and Markets, Present and Future / Ottilia Saxl.