Photo-excited charge collection spectroscopy probing the traps in field-effect transistors /

Photo-excited charge collection spectroscopy [electronic resource] : probing the traps in field-effect transistors / Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim.

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...

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Bibliographic Details
Online Access: Full Text (via Springer)
Main Author: Im, Seongil
Other Authors: Chang, Youn-Gyoung, Kim, Jae H. (Jae Hoon)
Format: Electronic eBook
Language:English
Published: Dordrecht ; New York : Springer, ©2013.
Series:SpringerBriefs in physics.
Subjects:
Field-effect transistors.
Photoelectron spectroscopy.
Table of Contents:
  • Device Stability and Photo-Excited Charge-Collection Spectroscopy
  • Instrumentations for PECCS
  • PECCS Measurements in Organic FETs
  • PECCS Measurements in Oxide FETs
  • PECCS Measurements in Nanostructure FETs
  • Summary and Limiting Factors of PECCS.

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