MARC

LEADER 00000nam a22000003u 4500
001 b7842441
003 CoU
005 20150309222206.2
006 m o d f
007 cr |||||||||||
008 150804e19810101||| ot f0|||||eng|d
035 |a (TOE)ost6711051 
035 |a (TOE)6711051 
040 |a TOE  |c TOE 
049 |a GDWR 
072 7 |a 14  |2 edbsc 
086 0 |a E 1.99:doe/jpl/954929-81/8 
086 0 |a E 1.99:doe/jpl/954929-81/8 
088 |a doe/jpl/954929-81/8 
245 0 0 |a Investigation of reliability attributes and accelerated stress factors on terrestrial solar cells. Third annual report  |h [electronic resource] 
260 |a Oak Ridge, Tenn. :  |b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,  |c 1981. 
300 |a Pages: 227 :  |b digital, PDF file. 
336 |a text  |b txt  |2 rdacontent. 
337 |a computer  |b c  |2 rdamedia. 
338 |a online resource  |b cr  |2 rdacarrier. 
500 |a Published through SciTech Connect. 
500 |a 01/01/1981. 
500 |a "doe/jpl/954929-81/8" 
500 |a Lathrop, J.W.; Hartman, R.A.; Saylor, C.R. 
500 |a Clemson Univ., SC (USA) 
520 3 |a The third year of the accelerated reliability testing program concentrated on electrical measurement instrumentation and in modeling cell behavior in the second quadrant. In addition, some preliminary work was done on correlating cell color changes with electrical degradation. Not reported are results of continuing accelerated stress tests on state of the art cells. A number of new cells were added to the program, but not in time for sufficient data to be obtained, while the older cells are undergoing extended test periods and new data are not yet available on them. The all-digital, microprocessor controlled, short interval tester, which was designed and fabricated, has replaced the manual measurement procedure formerly used. This has improved measurement accuracy and repeatability, reduced measurement time, and through coordinated data management procedures, eliminated data errors. A complete description of the tester including schematics and software is given and its operating procedures described. A computer model, based on the thermal and electrical properties of the cells and encapsulating materials, was developed to relate cell temperature to electrical characteristics in the second quadrant. This model adequately predicted the behavior of both encapsulated and unencapsulated cells, although accurate temperature measurements on encapsulated cells were difficult to obtain. In addition, only cells of one type were used for comparison and other cell types may require different parameter values for fitting. Use of the model should permit the prediction of a cell's sensitivity to degradation in the second quadrant. The computer program is listed together with a description of its operation. 
536 |b NAS-7-100-954929. 
650 7 |a Computer Codes.  |2 local. 
650 7 |a Solar Cells.  |2 local. 
650 7 |a Failures.  |2 local. 
650 7 |a Mathematical Models.  |2 local. 
650 7 |a Performance Testing.  |2 local. 
650 7 |a Boundary Conditions.  |2 local. 
650 7 |a Breakdown.  |2 local. 
650 7 |a Color.  |2 local. 
650 7 |a Computerized Simulation.  |2 local. 
650 7 |a Electric Currents.  |2 local. 
650 7 |a Electrical Properties.  |2 local. 
650 7 |a Humidity.  |2 local. 
650 7 |a Measuring Instruments.  |2 local. 
650 7 |a Microprocessors.  |2 local. 
650 7 |a Power Losses.  |2 local. 
650 7 |a Reliability.  |2 local. 
650 7 |a Solar Simulators.  |2 local. 
650 7 |a Stresses.  |2 local. 
650 7 |a Temperature Effects.  |2 local. 
650 7 |a Thermal Degradation.  |2 local. 
650 7 |a Weathering.  |2 local. 
650 7 |a Analog Systems.  |2 local. 
650 7 |a Computers.  |2 local. 
650 7 |a Currents.  |2 local. 
650 7 |a Direct Energy Converters.  |2 local. 
650 7 |a Electronic Circuits.  |2 local. 
650 7 |a Energy Losses.  |2 local. 
650 7 |a Equipment.  |2 local. 
650 7 |a Functional Models.  |2 local. 
650 7 |a Losses.  |2 local. 
650 7 |a Microelectronic Circuits.  |2 local. 
650 7 |a Optical Properties.  |2 local. 
650 7 |a Organoleptic Properties.  |2 local. 
650 7 |a Photoelectric Cells.  |2 local. 
650 7 |a Photovoltaic Cells.  |2 local. 
650 7 |a Physical Properties.  |2 local. 
650 7 |a Simulation.  |2 local. 
650 7 |a Simulators.  |2 local. 
650 7 |a Solar Equipment.  |2 local. 
650 7 |a Testing.  |2 local. 
650 7 |a Solar Energy.  |2 edbsc. 
700 1 |a Lathrop, J.W.  |4 aut. 
700 1 |a Hartman, R.A.  |4 aut. 
700 1 |a Saylor, C.R.  |4 aut. 
710 1 |a United States.  |b Department of Energy.  |b Office of Scientific and Technical Information.  |4 dst. 
710 2 |a Clemson University.  |4 res. 
856 4 0 |u http://www.osti.gov/servlets/purl/6711051/  |z Online Access 
907 |a .b78424410  |b 03-08-23  |c 11-07-14 
998 |a web  |b 08-04-15  |c f  |d m   |e p  |f eng  |g    |h 0  |i 2 
956 |a Information bridge 
999 f f |i 221300d2-69ef-524d-9d54-0fc69220209e  |s 1997a835-6427-51fe-84e3-ea0a0a0f7fe2 
952 f f |p Can circulate  |a University of Colorado Boulder  |b Online  |c Online  |d Online  |e E 1.99:doe/jpl/954929-81/8  |h Superintendent of Documents classification  |i web  |n 1