Lock-in Thermography : Basics and Use for Functional Diagnostics of Electronic Components / by Otwin Breitenstein, Martin Langenkamp.

The book deals with lock-in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady-state thermography, the lock-in mode enables a much improved signal/noise ratio (up to 1000x) by signal averaging, a far...

Full description

Bibliographic Details

Online Access:	Full Text (via Springer)
Main Author:	Breitenstein, O. (Otwin)
Other Authors:	Langenkamp, Martin
Format:	eBook
Language:	English
Published:	Berlin, Heidelberg : Springer Berlin Heidelberg, 2003.
Series:	Springer series in advanced microelectronics ; 10.
Subjects:	Engineering. Electronics. Optical materials. Nanotechnology.