Atomic force microscopy/scanning tunneling microscopy 2 [electronic resource] / edited by Samuel H. Cohen and Marcia L. Lightbody.

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU. S. Army Soldier Systems Command. A...

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Bibliographic Details

Online Access:	Full Text (via Springer)
Corporate Author:	U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors:	Cohen, Samuel H., Lightbody, Marcia L.
Other title:	Atomic force microscopy/scanning tunneling microscopy two
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	New York : Springer Science+Business Media, ©1997.
Subjects:	Atomic force microscopy > Congresses. Scanning tunneling microscopy > Congresses. Atomic force microscopy. Scanning tunneling microscopy. Conference papers and proceedings.