Film Deposition, Cryogenic RF Testing and Materials Analysis of a Nb/Cu Single Cell SRF Cavity [electronic resource]

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Bibliographic Details
Online Access: Online Access
Main Authors: Zhao, Xin (Author), Geng, Rongli (Author), Li, Yongming (Author), Palczerski, Ari (Author)
Corporate Author: Thomas Jefferson National Accelerator Facility (U.S.) (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. Office of Science ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2013.

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245 0 0 |a Film Deposition, Cryogenic RF Testing and Materials Analysis of a Nb/Cu Single Cell SRF Cavity  |h [electronic resource] 
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500 |a SRF2013, 23-27 Sept 2013. Paris, France. 
500 |a Zhao, Xin; Geng, Rongli; Li, Yongming; Palczerski, Ari. 
520 3 |a In this study, we present preliminary results on using a cathodic-arc-discharge Nb plasma ion source to establish a Nb film-coated single-cell Cu cavity for SRF research. The polycrystalline Cu cavity was fabricated and mirror-surface-finished by a centrifugal barrel polishing (CBP) process at Jefferson Lab. Special pre-coating processes were conducted, in order to create a template-layer for follow-on Nb grain thickening. A sequence of cryogenic RF testing demonstrated that the Nb film does show superconductivity. But the quality factor of this Nb/Cu cavity is low as a result of high residual surface resistance. We are conducting a thorough materials characterization to explore if some microstructural defects or hydrogen impurities, led to such a low quality factor. 
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700 1 |a Zhao, Xin  |4 aut. 
700 1 |a Geng, Rongli  |4 aut. 
700 1 |a Li, Yongming  |4 aut. 
700 1 |a Palczerski, Ari  |4 aut. 
710 2 |a Thomas Jefferson National Accelerator Facility (U.S.).  |4 res. 
710 1 |a United States.  |b Department of Energy.  |b Office of Science.  |4 spn. 
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