Film Deposition, Cryogenic RF Testing and Materials Analysis of a Nb/Cu Single Cell SRF Cavity [electronic resource]

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Bibliographic Details
Online Access:	Online Access
Main Authors:	Zhao, Xin (Author), Geng, Rongli (Author), Li, Yongming (Author), Palczerski, Ari (Author)
Corporate Author:	Thomas Jefferson National Accelerator Facility (U.S.) (Researcher)
Format:	Government Document Electronic eBook
Language:	English
Published:	Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. Office of Science ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2013.

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Call Number:	E 1.99: doe/or/23177-3231
E 1.99: doe/or/23177-3231	Available