Structures having enhanced biaxial texture [electronic resource]

Structures; Enhanced; Biaxial; Texture; Biaxially; Textured; Alloy; Article; Rolled; Annealed; Biaxially; Textured; Base; Metal; Substrate; Characterized; X-Ray; Diffraction; Phi; Scan; Peak; 20; Degree; Fwhm; Biaxially; Textured; Layer; Alloy; Material; Surface; Article; Electromagnetic; Device; El...

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Bibliographic Details
Online Access: Online Access
Main Authors: Goyal, Amit (Author), Norton, D. P. (David P.) (Author), Specht, Eliot D. (Author), Budai, John D. (Author), Kroeger, Donald M. (Author), Christen, David K. (Author)
Corporate Author: Lockheed Martin Energy Systems, Inc (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Oak Ridge, Tenn. : Oak Ridge, Tenn. : Lockheed Martin Energy Systems, Inc. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 1999.

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245 0 0 |a Structures having enhanced biaxial texture  |h [electronic resource] 
260 |a Oak Ridge, Tenn. :  |b Lockheed Martin Energy Systems, Inc. ;  |a Oak Ridge, Tenn. :  |b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,  |c 1999. 
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500 |a Published through SciTech Connect. 
500 |a 01/01/1999. 
500 |a "us 5958599" 
500 |a "US patent application 09/005381" 
500 |a Goyal, Amit; Norton, David P.; Specht, Eliot D.; Budai, John D.; Kroeger, Donald M.; Christen, David K. 
520 3 |a A biaxially textured alloy article includes a rolled and annealed biaxially textured base metal substrate characterized by an x-ray diffraction phi scan peak of no more than 20.degree. FWHM; and a biaxially textured layer of an alloy or another material on a surface thereof. The article further includes at least one of an electromagnetic device or an electro-optical device epitaxially joined to the alloy. 
520 0 |a Structures; Enhanced; Biaxial; Texture; Biaxially; Textured; Alloy; Article; Rolled; Annealed; Biaxially; Textured; Base; Metal; Substrate; Characterized; X-Ray; Diffraction; Phi; Scan; Peak; 20; Degree; Fwhm; Biaxially; Textured; Layer; Alloy; Material; Surface; Article; Electromagnetic; Device; Electro-Optical; Device; Epitaxially; Joined; Alloy; Textured Alloy; Metal Substrate; X-Ray Diffraction; Biaxially Textured; Biaxially Textured; Biaxially Textured; Base Metal; Optical Device; Biaxial Texture; Substrate Characterized; Textured Layer; Device Epitaxially; Electro-Optical Device; Enhanced Biaxial; Alloy Article; Magnetic Device. 
536 |b AC05-84OR21400. 
700 1 |a Goyal, Amit  |4 aut. 
700 1 |a Norton, D. P.  |q (David P.).  |4 aut. 
700 1 |a Specht, Eliot D.  |4 aut. 
700 1 |a Budai, John D.  |4 aut. 
700 1 |a Kroeger, Donald M.  |4 aut. 
700 1 |a Christen, David K.  |4 aut. 
710 2 |a Lockheed Martin Energy Systems, Inc.  |4 res. 
710 1 |a United States.  |b Department of Energy.  |b Office of Scientific and Technical Information.  |4 dst. 
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