Thickness measurement and target uniformity studies [electronic resource]

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Bibliographic Details
Online Access:	Online Access
Main Author:	Kobisk, E. H. (Author)
Corporate Author:	Oak Ridge National Laboratory (Researcher)
Format:	Government Document Electronic eBook
Language:	English
Published:	Washington, D.C. : Oak Ridge, Tenn. : U.S. Atomic Energy Commission ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 1966.
Subjects:	Atoms. Crystallization. Electron Microscopy. Epitaxy. Evaporation. Films. Impurities. Layers. Mass. Measured Values. Targets. Thickness. United Kingdom. Instrumentation. General.

Description
Item Description:	Published through SciTech Connect. 10/01/1966. "aere-r--5097-paper-26" " conf-651055--" Seminar on the preparation and standardization of isotopic targets and foils, Harwell (United Kingdom), 20-21 Oct 1965. Kobisk, E. H.
Physical Description:	Pages: 3 : digital, PDF file.

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