Optoelectronics Materials and Devices for Sensing and Imaging : 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2014, Harbin, China / Yadong Jiang, Junsheng Yu, Bernard Kippelen, editors ; sponsored by COS--The Chinese Optical Society (China), IOE--Institute of Optics and Electronics, Chinese Academy of Sciences (China) ; technical cosponsor, SPIE ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China) ; published by SPIE.
Saved in:
| Online Access: |
Full Text (via SPIE Digital Library) |
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| Corporate Authors: | , |
| Other Authors: | , , |
| Other title: | 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies. Seventh International Symposium on Advanced Optical Manufacturing and Testing Technologies. International Symposium on Advanced Optical Manufacturing and Testing Technologies. |
| Format: | Conference Proceeding eBook |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2014]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 9284. |
| Subjects: |
| Physical Description: | 1 online resource : illustrations (some color) |
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| Bibliography: | Includes bibliographical references. |
| ISSN: | 0277-786X ; |
| Source of Description, Etc. Note: | Description based on online resource; title from PDF title page (SPIE digital library, viewed February 11, 2015) |