Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples / Lydon J. Swartzendruber.

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Bibliographic Details
Online Access:	Search for the full-text version of this title in HathiTrust
Main Author:	Swartzendruber, L. J.
Corporate Author:	United States. National Bureau of Standards
Format:	Government Document Book
Language:	English
Published:	Washington, D.C. : U.S. Department of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., Govt. Print. Off, 1964.
Series:	NBS technical note ; 241.
Subjects:	Electric resistance. Semiconductors. FORTRAN (Computer program language)

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Holdings details from Norlin Library - Government Information - US
Call Number:	C 13.46:241
C 13.46:241	Available Place a Hold