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|a Reimer, Ludwig,
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|a Transmission electron microscopy
|h [electronic resource] :
|b physics of image formation /
|c L. Reimer, H. Kohl.
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|a 5th ed.
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|a New York, NY :
|b Springer,
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|a 1 online resource (xvi, 587 pages) :
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|a Springer series in optical sciences ;
|v 36.
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|a Includes bibliographical references (pages 491-574) and index.
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|a Introduction -- Particle optics of electrons -- Wave optics of electrons -- Elements of a transmission electron microscope -- Electron-specimen interactions -- Scattering and phase contrast for amorphous specimens -- Theory of electron diffraction -- Electron-diffraction modes and applications -- Imaging of crystalline specimens and their defects -- Elemental analysis by X-ray and election energy-loss spectroscopy -- Specimen damage by electron irradiation.
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|a Transmission electron microscopy.
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|a Transmission electron microscopy.
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|a Kohl, H.
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|t Transmission electron microscopy.
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