Advanced mathematical & computational tools in metrology & testing VIII / editors, F. Pavese [and others]

The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review v...

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Bibliographic Details

Online Access:	Full Text (via ProQuest)
Corporate Authors:	AMCTM VIII Paris, France, World Scientific (Firm)
Other Authors:	Pavese, Franco
Other title:	Advanced mathematical and computational tools in metrology and testing VIII. AMCTM 8.
Format:	Conference Proceeding eBook
Language:	English
Published:	Singapore ; Hackensack, N.J. : World Scientific, ©2009.
Series:	Series on advances in mathematics for applied sciences ; v. 78.
Subjects:	Measurement > Congresses. Physical measurements > Congresses. Metrology > Congresses. Measurement. Metrology. Physical measurements. Conference papers and proceedings.