Atomic force microscopy : understanding basic modes and advanced applications / Greg Haugstad.

"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration,...

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Bibliographic Details

Online Access:	Full Text (via ProQuest)
Main Author:	Haugstad, Greg, 1963- (Author)
Format:	eBook
Language:	English
Published:	Hoboken, New Jersey : John Wiley & Sons, Inc., 2012.
Edition:	First edition.
Subjects:	Atomic force microscopy. Atomic force microscopy