Search Results - "TA417.23"

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  1. 1
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    Scanning Probe Microscopy for Industrial Applications : Nanomechanical Characterization. by Yablon, Dalia G.

    Published 2014
    “…TA417.23…”
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  2. 2
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    Miniaturized testing of engineering materials / by Karthik, V.

    Published 2017
    “…TA417.23…”
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  3. 3
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    Quantitative Microbeam Analysis.

    Published 2017
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  4. 4
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    Electron backscatter diffraction in materials science /

    Published 2009
    “…TA417.23…”
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  5. 5
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    Electron microscopy and analysis 2003 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003 /

    Published 2004
    “…TA417.23…”
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  6. 6
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    X-ray optics and microanalysis, 1992 : proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK /

    Published 2020
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  7. 7
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    Specimen preparation for transmission electron microscopy of materials / by Goodhew, Peter J.

    Published 2020
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  8. 8
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    Surface microscopy with low energy electrons / by Bauer, Ernst

    Published 2014
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  9. 9
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    Field emission scanning electron microscopy : new perspectives for materials characterization / by Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald

    Published 2018
    “…TA417.23…”
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  10. 10
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    Miniaturized testing of engineering materials / by Karthik, V.

    Published 2017
    “…TA417.23…”
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