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  1. 1
    Semiconductor measurement technology : Measurement of transistor scattering parameters /

    Semiconductor measurement technology : Measurement of transistor scattering parameters / by Rogers, George J., Sawyer, David E., Jesch, Ramon L.

    Published 1975
    “…Semiconductor measurement technology.…”
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  2. 2
    Microelectronic test patterns : an overview /

    Microelectronic test patterns : an overview / by Buehler, Martin G.

    Published 1974
    “…Semiconductor measurement technology.…”
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  3. 3
    ARPA/NBS workshop I : measurement problems in integrated circuit processing and assembly /

    ARPA/NBS workshop I : measurement problems in integrated circuit processing and assembly / by Schafft, Harry A.

    Published 1974
    “…Semiconductor measurement technology.…”
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  4. 4
    Semiconductor measurement technology : BASIC program for calculating dopant density profiles from capacitance-voltage data /

    Semiconductor measurement technology : BASIC program for calculating dopant density profiles from capacitance-voltage data / by Mattis, Richard L., Buehler, Martin G.

    Published 1975
    “…Semiconductor measurement technology.…”
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  5. 5
    Semiconductor measurement technology : Optical and dimensional-measurement problems with photomasking in microelectronics /

    Semiconductor measurement technology : Optical and dimensional-measurement problems with photomasking in microelectronics / by Jerke, John M.

    Published 1975
    “…Semiconductor measurement technology.…”
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  6. 6
    Semiconductor measurement technology, Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes /

    Semiconductor measurement technology, Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes / by Sher, Alvin H.

    Published 1975
    “…Semiconductor measurement technology.…”
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  7. 7
    Semiconductor measurement technology, ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses] /

    Semiconductor measurement technology, ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses] / by Schafft, Harry A.

    Published 1974
    “…Semiconductor measurement technology.…”
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  8. 8
    Workshop on Mass Flow Measurement and Control for the Semiconductor Industry

    Workshop on Mass Flow Measurement and Control for the Semiconductor Industry

    Published 2001
    “…Semiconductor measurement technology.…”
    Government Document Conference Proceeding Microfilm Book
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  9. 9
    Planar test structures for characterizing impurities in silicon /

    Planar test structures for characterizing impurities in silicon /

    Published 1976
    “…Semiconductor measurement technology.…”
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  10. 10
    Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage ion implanted dopants in silicon /

    Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage ion implanted dopants in silicon / by Albers, John

    Published 1987
    Government Document Microfilm Book
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  11. 11
    Microelectronic ultrasonic bonding /

    Microelectronic ultrasonic bonding / by Harman, George G.

    Published 1974
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  12. 12
    A wafer chuck for use between -196 and 350C̊ /

    A wafer chuck for use between -196 and 350C̊ / by Koyama, R. Y.

    Published 1979
    “…Semiconductor measurement technology.…”
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  13. 13
    ARPA/NBS Workshop V, moisture measurement technology for hermetic semiconductor devices : proceedings of the ARPA/NBS Workshop V, held at the National Bureau of Standards, Gaithersburg, MD, March 22-23, 1978 /

    ARPA/NBS Workshop V, moisture measurement technology for hermetic semiconductor devices : proceedings of the ARPA/NBS Workshop V, held at the National Bureau of Standards, Gaithers...

    Published 1981
    “…Semiconductor measurement technology.…”
    Government Document Book
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  14. 14
    The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon /

    The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon /

    Published 1981
    “…Semiconductor measurement technology.…”
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  15. 15
    A manual wafer probe station for an integrated circuit test system /

    A manual wafer probe station for an integrated circuit test system / by Carver, G. P.

    Published 1981
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  16. 16
    INSTANT-IGBT network simulation and transient ANalysis tool

    INSTANT-IGBT network simulation and transient ANalysis tool by Hefner, A. R. (Allen R.)

    Published 1992
    Government Document Microfilm Book
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  17. 17
    Version 2.0 of the TXYZ thermal analysis program, TXYZ20

    Version 2.0 of the TXYZ thermal analysis program, TXYZ20 by Albers, John

    Published 1992
    “…Semiconductor measurement technology.…”
    Government Document Microfilm Book
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  18. 18
    A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements /

    A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements / by Goodman, Alvin M.

    Published 1977
    “…Semiconductor measurement technology.…”
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  19. 19
    Microelectronic test pattern NBS-4 /

    Microelectronic test pattern NBS-4 / by Thurber, W. Robert

    Published 1978
    “…Semiconductor measurement technology.…”
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  20. 20
    Automated photomask inspection /

    Automated photomask inspection / by Novotny, Donald B.

    Published 1978
    “…Semiconductor measurement technology.…”
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