Cover Image

Proceedings / Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

Show other versions (8)
Saved in:
Bibliographic Details
Online Access: Request a PDF (UCB only)
Previous Title:IEEE Semiconductor Thermal and Temperature Measurement Symposium. Proceedings
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium, IEEE Components, Hybrids, and Manufacturing Technology Society
Other title:IEEE SEMI-THERM Symposium.
Format: Conference Proceeding
Language:English
Published: New York, NY : Institute of Electrical and Electronics Engineers, ©1991-
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Amorphous semiconductors > Thermal properties > Congresses.
Integrated circuits > Congresses.
Amorphous semiconductors > Thermal properties.
Integrated circuits.
Semiconductors > Cooling.
Semiconductors > Thermal properties.
Conference papers and proceedings.

Internet

Request a PDF (UCB only)

PASCAL Offsite

Holdings details from PASCAL Offsite
Call Number: TK7871.85 I27
Volume Holdings: (ord.)7th (1991) - (ord.)17th (2001)
TK7871.85 I27 (7th 1991) Available Place a Hold
TK7871.85 I27 (8th 1992) Available Place a Hold
TK7871.85 I27 (9th 1993) Available Place a Hold
TK7871.85 I27 (10th 1994) Available Place a Hold
TK7871.85 I27 (11th 1995) Available Place a Hold
TK7871.85 I27 (12th 1996) Available Place a Hold
TK7871.85 I27 (13th 1997) Available Place a Hold
TK7871.85 I27 (14th 1998) Available Place a Hold
TK7871.85 I27 (15th 1999) Available Place a Hold
TK7871.85 I27 (16th 2000) Available Place a Hold
TK7871.85 I27 (17th 2001) Available Place a Hold

Similar Items