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Proceedings / Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

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Previous Title:IEEE Semiconductor Thermal and Temperature Measurement Symposium. Proceedings
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium, IEEE Components, Hybrids, and Manufacturing Technology Society
Other title:IEEE SEMI-THERM Symposium.
Format: Conference Proceeding
Language:English
Published: New York, NY : Institute of Electrical and Electronics Engineers, ©1991-
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Amorphous semiconductors > Thermal properties > Congresses.
Integrated circuits > Congresses.
Amorphous semiconductors > Thermal properties.
Integrated circuits.
Semiconductors > Cooling.
Semiconductors > Thermal properties.
Conference papers and proceedings.
Description
Published:7th (1991)-
Item Description:Title from cover.
Physical Description:volumes : illustrations ; 29 cm.
Also issued online.
Publication Frequency:Annual.
ISSN:1065-2221
Additional Physical Form available Note:Also issued online.
Action Note:committed to retain 20180101 20430101 Alliance Shared Trust https://www.coalliance.org/shared-print-archiving-policies.
Issuing Body Note:Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.

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