Metrology and standardization of nanotechnology : protocols and industrial innovations / edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
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Full Text (via EBSCO) |
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Other Authors: | , , , |
Format: | eBook |
Language: | English |
Published: |
Weinheim, Germany :
Wiley-VCH,
2017.
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Series: | Nanotechnology innovation & applications.
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Subjects: |
Internet
Full Text (via EBSCO)Online
Call Number: |
T174.7
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T174.7 | Available |