VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

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Bibliographic Details
Online Access:	Full Text (via O'Reilly/Safari)
Other Authors:	Wang, Laung-Terng (Editor), Wu, Cheng-Wen, EE Ph. D. (Editor), Wen, Xiaoqing (Editor)
Format:	eBook
Language:	English
Published:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Design and construction Integrated circuits > Very large scale integration > Design Integrated circuits > Very large scale integration > Testing Academic theses