VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

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Bibliographic Details
Online Access:	Publisher description
Other Authors:	Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Format:	Book
Language:	English
Published:	Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, ©2006.
Series:	Morgan Kaufmann series in systems on silicon.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design.

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Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number:	TK7874.75 .V587 2006
TK7874.75 .V587 2006	Available Place a Hold