Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi.
Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipati...
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Full Text (via Springer) |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
©2003.
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| Series: | Frontiers in electronic testing ;
22. |
| Subjects: |
Internet
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| Call Number: |
TK7874.75 .N53 2003eb
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| TK7874.75 .N53 2003eb | Available |