Hybrid microcircuit reliability data / prepared by IIT Research Institute.

Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...

Full description

Bibliographic Details

Online Access:	Full Text (via ScienceDirect)
Corporate Author:	IIT Research Institute
Format:	eBook
Language:	English
Published:	Oxford ; New York : Pergamon Press, 1976.
Subjects:	Hybrid integrated circuits > Reliability.