Hybrid microcircuit reliability data / prepared by IIT Research Institute.
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...
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| Online Access: |
Full Text (via ScienceDirect) |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Oxford ; New York :
Pergamon Press,
1976.
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| Subjects: |
MARC
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| 245 | 1 | 0 | |a Hybrid microcircuit reliability data / |c prepared by IIT Research Institute. |
| 264 | 1 | |a Oxford ; |a New York : |b Pergamon Press, |c 1976. | |
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| 505 | 0 | |a Front Cover ; Hybrid Microcircuit Reliability Data; Copyright Page; Table of Contents; INTRODUCTION; SECTION 1. EXPERIENCED vs PREDICTED FAILURE RATES; SECTION 2. SCREENING SUMMARY; SECTION 3. FAILURE CLASSIFICATIONS; SECTION 4. CROSS REFERENCE INDEX; SECTION 5. DETAILED TEST DATA TABULATION; APPENDIX; HYBRID MICROCIRCUIT DESCRIPTOR CODE INTERPRETATIONS. | |
| 520 | |a Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use. | ||
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