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VLSI design and test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers / S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.)

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Bibliographic Details
Online Access:	Full Text (via Springer)
Corporate Author:	VDAT (Symposium) Madurai, India)
Other Authors:	Rajaram, S., 1973- (Editor), Balamurugan, N. B. (Editor), Gracia Nirmala Rani, D. (Editor), Singh, Virendra (Associate professor of electrical engineering) (Editor)
Other title:	VDAT 2018.
Format:	Conference Proceeding eBook
Language:	English
Published:	Singapore : Springer, 2019.
Series:	Communications in computer and information science ; 892.
Subjects:	Integrated circuits > Very large scale integration > Testing > Congresses. Integrated circuits > Very large scale integration > Design and construction > Congresses. Integrated circuits > Very large scale integration > Design and construction. Integrated circuits > Very large scale integration > Testing. Conference papers and proceedings.

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Call Number:	TK7874.75
TK7874.75	Available