Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section.

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Bibliographic Details
Corporate Authors:	International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Other title:	International Test Conference 1983 proceedings.
Format:	Conference Proceeding Book
Language:	English
Published:	Silver Spring, MD : IEEE Computer Society Press, 1983.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Automatic test equipment > Congresses. Automatic test equipment. Electronic digital computers > Circuits > Testing. Integrated circuits > Testing. Conference papers and proceedings.

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Holdings details from PASCAL Offsite
Call Number:	TK7874 .I593 1983
TK7874 .I593 1983	Available Place a Hold