Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method [electronic resource] : a feasibility analysis.

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Bibliographic Details
Online Access:	Full Text (via OSTI)
Format:	Electronic eBook
Language:	English
Published:	Oak Ridge, Tenn. : Distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2020.
Subjects:	14 solar energy 30 direct energy conversion 36 materials science 47 other instrumentation 77 nanoscience and nanotechnology Tomic force microscopy (afm) Conductivity Current Intermittent contact Fourier analysis Tapping-mode afm

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