Atomic force microscopy in nanobiology / edited by Kunio Takeyasu.

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and forc...

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Bibliographic Details
Online Access: Full Text (via Taylor & Francis)
Other Authors: Takeyasu, Kunio (Editor)
Format: eBook
Language:English
Published: Boca Raton, Florida : CRC Press, [2014]
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Call Number: QH261 .A86 2014eb
QH261 .A86 2014eb Available