Standard reference materials : antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems / Carol F. Vezzetti, Ruth N. Varner.

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Bibliographic Details
Online Access:	Online Access
Main Author:	Vezzetti, Carol F.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Varner, Ruth N.
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Series:	NIST special publication ; 260-117.

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Call Number:	C 13.10:260-117
C 13.10:260-117	Available