Applications and Metrology at Nanometer-Scale 2 Measurement Systems, Quantum Engineering and RBDO Method.

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Bibliographic Details
Online Access: Full Text (via ProQuest)
Main Author: Dahoo, Pierre-Richard
Other Authors: Pougnet, Philippe, El Hami, Abdelkhalak
Format: eBook
Language:English
Published: Newark : John Wiley & Sons, Incorporated, 2021.

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Call Number: QC88 .D346 2021
QC88 .D346 2021 Available