Logic testing and design for testability [electronic resource] / Hideo Fujiwara.

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Bibliographic Details
Online Access:	Full Text (via MIT Press)
Main Author:	Fujiwara, Hideo
Format:	Electronic eBook
Language:	English
Published:	Cambridge, Mass. : MIT Press, ©1985.
Series:	MIT Press series in computer systems.
Subjects:	Logic circuits > Testing.

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Full Text (via MIT Press)

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Call Number:	TK7888.3
TK7888.3	Available