System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semic...

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